Dwiyedi, Neeraj and Kumar, Sushi and Tripathi, R. K. and Carey, J. D. and Malik, Hitendra K. and Dalai, M. K. (2012) Structural and Electronic Characterization of Nanocrystalline Diamondlike Carbon Thin Films. ACS Applied Materials and Interfaces, 4 (10). 5309-5316. ISSN 1944-8244

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Abstract

The origin of low threshold field-emission (threshold field 1.25 V/mu m) in nanocrystalline diamond-like carbon (nc-DLC) thin films is examined. The introduction of nitrogen and thermal annealing are both observed to change the threshold field and these changes are correlated with changes to the film microstructure. A range of different techniques including micro-Raman and infrared spectroscopy, X-my diffraction, electron microscopy, energy-dispersive X-ray analysis and time-of-flight-secondary ion mass spectroscopy are used to examine the properties of the films. A comparison of the field emission properties of nc-DLC films with atomically smooth amorphous DLC (a DLC) films reveals that nc-DLC films have lower threshold fields. Our results show that nc-DLC can be a good candidate for large area field emission display panels and cold cathode emission devices.

Item Type:	Article
Additional Information:	copyright for this article belongs to M/s American Chemical Society
Subjects:	Materials Science Nanoscience/ Nanotechnology
Divisions:	UNSPECIFIED
Depositing User:	Users 27 not found.
Date Deposited:	19 Aug 2026 11:00
Last Modified:	19 Aug 2026 11:00
URI:	https://npl.csircentral.net/id/eprint/3415

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