Article

Reddy, Anurag G. and Aggarwal, Neha and T. C., Shibin Krishna and Singh, Manju and Rakshit, Rajib and Gupta, Govind (2015) Correlation of current-voltage-temperature analysis with deep level defects in epitaxial GaN films. Applied Physics Letters, 106 (23). pp. 233501-1. ISSN 0003-6951