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Reddy, Anurag G. and Aggarwal, Neha and T. C., Shibin Krishna and Singh, Manju and Rakshit, Rajib and Gupta, Govind (2015) Correlation of current-voltage-temperature analysis with deep level defects in epitaxial GaN films. Applied Physics Letters, 106 (23). pp. 233501-1. ISSN 0003-6951
