Srivastava, A. K. (2008) Direct evidence for electron beam irradiation-induced phenomena in nanowired ZnO thin films. Materials Letters , 32 (27). pp. 4296-4298. ISSN 0167-577X

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Abstract

In-situ electron beam induced microstructural transformation experiments, leading to porosity in nanowires of ZnO, have been performed under a TEM operated at an electron accelerating voltage of 200 kV. For this purpose, nanowired (diameter: 20 to 80 nm) films of ZnO with thickness ~ 100 to 120 nm, were grown via metal-catalyst free-vapor phase mechanism. The evolved porosity (pore size about 2 to 20 nm) in nanowires, under electron beam irradiation, has been attributed to different bond-breaking phenomena at molecular Zn–O. Such nanoporous objects of ZnO are beneficial for various optical and sensing devices.

Item Type:	Article
Additional Information:	Copyright for this article belongs to M/s Elsevier B.V.
Subjects:	Materials Science Physics
Divisions:	UNSPECIFIED
Depositing User:	Ms Neetu Chandra
Date Deposited:	11 Jul 2013 10:12
Last Modified:	11 Jul 2013 10:12
URI:	http://npl.csircentral.net/id/eprint/978

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