Kumar, Praveen and Devi, Pooja and Rodriguez, P. E. D. S. and Kumar, Manish and Shivling, V. D. and Noetzel, Richard and Sharma, Chhavi and Sinha, R. K. and Kumar, Mahesh (2018) Ultrafast Carrier dynamics of In(x)Ga1(-x)N nanostructures grown directly on Si (111). Optical Materials, 79. pp. 475-479. ISSN 0925-3467

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Abstract

We show a flux dependence changes in structural, optical and electronic properties of InxGa1-xN nanostructures (NSs) namely nanocolumns (NCs), nanoflakes (NFs) and nanowall network (NWN) grown directly on Si(111) surface. Field emission scanning electron microscopy (FESEM) images were recorded to see morphological changes from NFs to NCs and NWNc etc, while high-resolution X-ray diffraction (HRXRD) omega - 2 theta scans were used to determine In incorporation. The maximum In incorporation was observed to be 20, 33 and 38% for the sharp transition from NFs to NCs and NWNs, respectively. The charge carrier dynamics of these grown NSs were probed using Ultrafast Femtosecond Transient Absorption Spectroscopy (UFTAS) with excitation at 350 nm pump wavelength. The UFTAS studies show the comparative charge carriers dynamics of the NWS, NCs and NFs. The charge carrier studies show a higher lifetime in NWNs as compare to NCs and NFs. Further, to examine electronic structure and level of degeneracy of these NSs, core-level and valence band spectra were analyzed by X-ray photoelectron spectroscopy (XPS), which manifest the upward band bending ranging from 0.2 eV to 0.4 eV.

Item Type:	Article
Additional Information:	Copyright for this article belongs to M/s Elsevier.
Subjects:	Materials Science Optics
Divisions:	UNSPECIFIED
Depositing User:	Mr. Yogesh Joshi
Date Deposited:	25 Feb 2019 11:38
Last Modified:	25 Feb 2019 11:38
URI:	http://npl.csircentral.net/id/eprint/4013

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