Rout, P. K. and Joshi, P. C. and Porwal, Rajni and Budhani, R. C. (2012) Electronic reconstruction and enhanced superconductivity at La1.6-xNd0.4SrxCuO4/La1.55Sr0.45CuO4 bilayer interface. EPL (Europhysics Letters), 98 (6). pp. 67007-67013. ISSN 0295-5075

PDF - Published Version Restricted to Registered users only Download (674Kb) | Request a copy

Abstract

We report enhanced superconductivity in bilayer thin films consisting of superconducting La1.6-xNd0.4SrxCuO4 with 0.06 <= x < 0.20 and metallic but non-superconducting La1.55Sr0.45CuO4. These bilayers show a maximum increase in superconducting transition temperature (T-c) of more than 200% for x = 0.06, while no change in T-c is observed for the bilayers with x >= 0.20. The analysis of the critical current and kinetic inductance data suggests 2-3 unit cells thick interfacial layer electronically perturbed to have a higher T-c. A simple charge transfer model with cation intermixing explains the observed T-c in bilayers. Still the unusually large thickness of interfacial superconducting layers cannot be explained in terms of this model. We believe that the stripe relaxation as well as the proximity effect also influence the superconductivity of the interface.

Item Type:	Article
Additional Information:	Copyright for this article belongs to M/s Institute of Physics.
Subjects:	Physics
Divisions:	UNSPECIFIED
Depositing User:	Users 27 not found.
Date Deposited:	04 Mar 2020 11:23
Last Modified:	04 Mar 2020 11:23
URI:	http://npl.csircentral.net/id/eprint/3597

Actions (login required)

View Item