Kumar, Pramod and Dogra, Anjana and Toutam, Vijaykumar (2013) Pinhole mediated electrical transport across LaTiO3/SrTiO3 and LaAlO3/SrTiO3 oxide hetero-structures. Applied Physics Letters, 103 (21). 211601-1- 211601-4. ISSN 0003-6951
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Abstract
Metal-insulator-metal configuration of LaTiO3/SrTiO3 and LaAlO3/SrTiO3 hetero-structures between two dimensional electron gas formed at the interface and different area top electrodes is employed for Conductive Atomic force microscopy (CAFM) imaging, Current-Voltage (I-V), and Capacitance-Voltage (C-V) spectroscopy. Electrode area dependent I-V characteristics are observed for these oxide hetero-structures. With small area electrodes, rectifying I-V characteristics are observed, compared to, both tunneling and leakage current characteristics for large area electrodes. CAFM mapping confirmed the presence of pinholes on both surfaces. Resultant I-V characteristics have a contribution from both tunneling and leakage due to pinholes.
Item Type: | Article |
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Additional Information: | Copyright for this article belongs to M/s American Institute of Physics. |
Subjects: | Applied Physics/Condensed Matter |
Divisions: | UNSPECIFIED |
Depositing User: | Users 27 not found. |
Date Deposited: | 03 Jul 2020 11:03 |
Last Modified: | 03 Jul 2020 11:03 |
URI: | http://npl.csircentral.net/id/eprint/3094 |
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