Rajan, Gopeeka and Yadav, Vandana and Manzhi, Payal and Chauhan, Gayatri and Suman, C. K. and Srivastava, Ritu and Sinha, O. P. (2017) Study of injection and transport properties of metal/organic interface using HAT-CN molecules as hole injection layer. Vacuum, 146. pp. 530-536. ISSN 0042-207X

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Abstract

1,4,5,8,9,11-hexaazatriphenylene-hexacarbonitrile (HAT-CN) molecule have been studied as hole injection layer for application in organic semiconductor based devices with potential to modify the electronic properties of electrodes due to its strong electron-withdrawing property. Thermally stable hole transport material 2, 7-bis [N, N-bis (4-methoxy-phenyl) amino] -9, 9-spirobifluorene (MeO-Spiro-TPD) has been used to fabricate hole only devices. To make the injection efficient at metal/organic interface and to reduce the driving voltage of the organic devices, the interface has been modified with a thin layer of highly electron accepting HAT-CN material. Modified interface has been investigated at a different range of thicknesses of HAT-CN. This interface modification resulted in the switching of injection limited transport to space charge limited conduction mechanism with the introduction of HAT-CN layer at metal/organic interfaces. The hole injection property has been found to increase with an increase in HAT-CN thickness. When these modified substrates were used as a hole injecting contacts in organic light emitting diodes (OLEDs), they have shown an increase in current density and device efficiency.

Item Type:	Article
Additional Information:	Copyright for this article belongs to M/S Elsevier.
Subjects:	Materials Science Applied Physics/Condensed Matter
Divisions:	UNSPECIFIED
Depositing User:	Users 27 not found.
Date Deposited:	18 Apr 2019 11:43
Last Modified:	18 Apr 2019 11:43
URI:	http://npl.csircentral.net/id/eprint/2887

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