Kumar, Amit and Singh, F. and -, Govind and Shivaprasad, S. M. and Avasthi, D. K. and Pivin, J. C. (2008) X-ray photoelectron and X-ray Auger electron spectroscopy studies of heavy ion irradiated C-60 films. Applied Surface Science, 254 (22). pp. 7280-7284. ISSN 0169-4332

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Abstract

The influence of 200 MeV Au ion irradiation on the surface properties of polycrystalline fullerene films has been investigated. The X-ray photoelectron and X-ray Auger electron spectroscopy are employed to study the ion-induced modification of the fullerene, near the surface region. The shift of C 1s core level and decrease in intensity of shake-up satellite were used to investigate the structural changes (like sp(2) to sp(3) conversion) and reduction of pi electrons, respectively, under heavy ion irradiation. Further, X-ray Auger electron spectroscopy was employed to investigate hybridization conversion qualitatively as a function of ion fluence.

Item Type:	Article
Additional Information:	Copyright for this article belongs to M/s Elsevier B.V.
Subjects:	Chemistry Chemistry > Applied Chemistry Materials Science Physics
Divisions:	UNSPECIFIED
Depositing User:	Ms Neetu Chandra
Date Deposited:	06 Apr 2017 07:19
Last Modified:	06 Apr 2017 07:19
URI:	http://npl.csircentral.net/id/eprint/2089

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