Article

Moona, G. and Kumar, V and Jewariya, M. and Sharma, R. and Kumar, H. (2019) Measurement Uncertainty Evaluation Using Monte Carlo Simulation for Newly Established Line Scale Calibration Facility at CSIR-NPLI. Mapan, 34 (3 (SI)). 325-331. ISSN 0970-3950

Moona, G. and Jewariya, M. and Sharma, R. (2019) Relevance of Dimensional Metrology in Manufacturing Industries. Mapan, 34 (1). pp. 97-104. ISSN 0970-3950

Kushvaha, S. S. and Kumar, M. Senthil and Shukla, A. K. and Yadav, B. S. and Singh, Dilip K. and Jewariya, M. and Ragam, S. R. and Maurya, K. K. (2015) Structural, optical and electronic properties of homoepitaxial GaN nanowalls grown on GaN template by laser molecular beam epitaxy. RSC Advances, 5 (107). 87818 -87830. ISSN 2046-2069