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Dugar, Palak and Kumar, Mahesh and T. C, Shibin Krishna and Aggarwal, Neha and Gupta, Govind (2015) Carrier relaxation dynamics in defect states of epitaxial GaN/AlN/Si using ultrafast transient absorption spectroscopy. RSC Advances, 5 (102). pp. 83969-83975. ISSN 2046-2069
