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Chakraborty, B. R. and Shard, A. G. and Dalai, M. K. and Sehgal, G. (2014) Depth profiling of Irganox-3114 nanoscale delta layers in a matrix of Irganox-1010 using conventional Cs+ and O-2(+) ion beams. Surface and Interface Analysis, 46 (1). 36-41 . ISSN 0142-2421
