Panwar, O. S. and Khan, M. A. and Kumar, Satyendra and Basu, A. and Mehta , B. R. and Kumar, Sushil and -, Ishpal (2010) Effect of high substrate bias and hydrogen and nitrogen incorporation on spectroscopic ellipsometric and atomic force microscopic studies of tetrahedral amorphous carbon films. Surface & Coatings Technology, 205 (7). pp. 2126-2133. ISSN 0257-8972

Panwar, O. S. and Khan, Mohd Alim and Basu, A . and Kumar, Satyendra and Kumar, Sushil (2009) Analysis of dielectric constants to determine sp(3)/sp(2) ratio and effect of substrate bias on spectroscopic ellipsometric studies of tetrahedral amorphous carbon films grown using an S bend filtered cathodic vacuum arc process. Indian Journal of Pure & Applied Physics, 47 (2). pp. 141-148. ISSN 0975-1041