Article

Kumar, Rajesh and Rab, Shanay and Pant, B. D. and Maji, S. (2018) Design, development and characterization of MEMS silicon diaphragm force sensor. Vacuum, 153. pp. 211-216. ISSN 0042-207X

Kumar, Harish and Moona, Girija and Arora, P. K. and Haleem, Abid and Singh, Jasveer and Kumar, Rajesh and Kumar, Anil (2017) Monte carlo method for evaluation of uncertainty of measurement in brinell hardness scale. Indian Journal of Pure and Applied Physics, 55. pp. 445-453. ISSN 0019-5596

Kumar, Rajesh and Kumar, Harish and Kumar, Anil and -, Vikram (2012) Long Term Uncertainty Investigations of 1 MN Force Calibration Machine at NPL, India (NPLI). Measurement Science Review, 12 (4). pp. 149-152. ISSN 1335-8871

Kumar, Rajesh and Gupta, Ajai K. and Singh, D. P. and Kumar, Vijay and Bhalla , G. L. and Khare, Neeraj (2008) Current-induced effect on resistivity and magnetoresistance of La0.67Ba0.33MnO3 manganite. Journal of Magnetism and Magnetic Materials, 320 (1). pp. 2741-2745. ISSN 0304-8853

Gupta, Ajai K. and Kumar, Rajesh and Kumar, Vijay and Bhalla, G. L. and Khare, Neeraj (2008) Study of magnetotransport in double-layered La1.4Ca1.6Mn2O7 manganite: Presence of nano-ferromagnetic domains in paramagnetic matrix. Journal of Physics and Chemistry of Solids, 70 (1). pp. 117-121. ISSN 0022-3697

Kumar, Rajesh and Khare, Neeraj and Kumar, Vijay and Bhalla, G. L. (2008) Effect of intrinsic stress on the optical properties of nanostructured ZnO thin films grown by rf magnetron sputtering. Applied Surface Science, 254 (20). pp. 6509-6513. ISSN 0169-4332

Kumar, Rajesh and Khare, Neeraj (2007) Temperature dependence of conduction mechanism of ZnO and co-doped ZnO thin films. Thin Solid Films, 516 (6). pp. 1302-1307. ISSN 0040-6090

Kumar, Rajesh and Khare, Neeraj and Kumar, Vijay and Bhalla, G. L. and Srivastava, Ritu and Chauhan, Gayatri and Kamalasanan, M. N. (2009) Fabrication and current–voltage characteristics of ZnO/α NPD based inorganic–organic hybrid structure. Semiconductor Science and Technology, 24 (4). 045020-1-045020-3. ISSN 0268-1242