Article

Dugar, Palak and Kumar, Mahesh and T. C, Shibin Krishna and Aggarwal, Neha and Gupta, Govind (2015) Carrier relaxation dynamics in defect states of epitaxial GaN/AlN/Si using ultrafast transient absorption spectroscopy. RSC Advances, 5 (102). pp. 83969-83975. ISSN 2046-2069

Krishna, T. C. Shibin and Aggarwal, Neha and Reddy, G. Anurag and Dugar, Palak and Mishra, Monu and Goswami, Lalit and Dilawar, Nita and Kumar, Mahesh and Maurya, K. K. and Gupta, Govind (2015) Probing the correlation between structure, carrier dynamics and defect states of epitaxial GaN film on (11(2)over-bar0) sapphire grown by rf-molecular beam epitaxy. RSC Advances, 5 (89). pp. 73261-73267. ISSN 2046-2069