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Panwar, O. S. and Khan, Mohd Alim and Basu, A . and Kumar, Satyendra and Kumar, Sushil (2009) Analysis of dielectric constants to determine sp(3)/sp(2) ratio and effect of substrate bias on spectroscopic ellipsometric studies of tetrahedral amorphous carbon films grown using an S bend filtered cathodic vacuum arc process. Indian Journal of Pure & Applied Physics, 47 (2). pp. 141-148. ISSN 0975-1041

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