Verma, Kuldeep Chand and Singh, Virender Pratap and -, Mast Ram and Shah, Jyoti and Kotnala, R. K. (2011) Structural, microstructural and magnetic properties of NiFe2O4, CoFe2O4 and MnFe2O4 nanoferrite thin films. Journal of Magnetism and Magnetic Materials, 323 (24). pp. 3271-3275. ISSN 0304-8853

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Abstract

The structural, microstructural and magnetic properties of nanoferrite NiFe2O4 (NF), CoFe2O4 (CF) and MnFe2O4 (MF) thin films have been studied. The coating solution of these ferrite films was prepared by a chemical synthesis route called sol–gel combined metallo-organic decomposition method. The solution was coated on Si substrate by spin coating and annealed at 700 °C for 3 h. X-ray diffraction pattern has been used to analyze the phase structure and lattice parameters. The scanning electron microscopy (SEM) and atomic force microscopy (AFM) have been used to show the nanostructural behavior of these ferrites. The values of average grain's size from SEM are 44, 60 and 74 nm, and from AFM are 46, 61 and 75 nm, respectively, measured for NF, CF and MF ferrites. At room temperature, the values of saturation magnetization, Ms∼50.60, 33.52 and 5.40 emu/cc, and remanent magnetization, Mr∼14.33, 15.50 and 1.10 emu/cc, respectively, are observed for NF, CF and MF. At low temperature measurements of 10 K, the anisotropy of ferromagnetism is observed in these ferrite films. The superparamagnetic/paramagnetic behavior is also confirmed by χ′(T) curves of AC susceptibility by applying DC magnetizing field of 3 Oe. The temperature dependent magnetization measurements show the magnetic phase transition temperature.

Item Type:	Article
Additional Information:	Copyright for this article belongs to M/s Elsevier B.V.
Uncontrolled Keywords:	Nanoferrites thin film; Chemical synthesis; AFM; Magnetic properties
Subjects:	Materials Science Applied Physics/Condensed Matter Physics
Divisions:	UNSPECIFIED
Depositing User:	Mr. Abhishek Yadav
Date Deposited:	25 Oct 2012 09:09
Last Modified:	25 Oct 2012 09:09
URI:	http://npl.csircentral.net/id/eprint/754

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