Kumar, Krishnamurthy Senthil and Babu, Sridharan Moorthy and Bhagavannarayana, G. (2011) Study of the influence of dopants on the crystalline perfection of ferroelectric glycine phosphite single crystals using high-resolution X-ray diffraction analysis. Journal of Applied Crystallography, 44. 313-318 . ISSN 0021-8898

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Good quality and optically transparent single crystals of pure and doped glycine phosphite (GPI) were grown by both solvent-evaporation and temperature-cooling techniques. Dopants were chosen in different categories, namely transition metals (Cr, Mn, Co, Ni, Zn, Mg, Cd), rare-earth metals (Ce, Nd, La), dyes (rhodamine B, malachite green, fluorescein) and an amino acid (L-proline). The concentration of dopants was chosen depending on the category of dopants and the quality of crystallization during the growth process. The crystalline perfection of the as-grown pure and doped GPI crystals was investigated by high-resolution X-ray diffraction at room temperature. A multicrystal X-ray diffractometer employing a well collimated and highly monochromated Mo K[alpha]1 beam and set in the (+, -, -, +) configuration was employed. Most of the crystal specimens show excellent crystalline perfection. However, grain boundaries, low-angle tilt boundaries, and vacancy and interstitial point defects were observed in some crystal specimens.

Item Type: Article
Uncontrolled Keywords: crystal growth from solutions; ferroelectric materials; high-resolution X-ray diffraction;
Subjects: Crystallography
Depositing User: Mr. Abhishek Yadav
Date Deposited: 17 Oct 2012 11:59
Last Modified: 17 Oct 2012 11:59
URI: http://npl.csircentral.net/id/eprint/713

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