Sharma, P. and Singhal, R. and Vishnoi, R. and Sharma, G. D. and Kulriya, P. and Ojha, S. and Banerjee, M. K. and Chand, S. (2019) Evolution of SPR in 120MeV silver ion irradiated Cu (18%) C-60 nanocomposites thin films. Journal of Materials Science: Materials in Electronics, 30 (9). pp. 8301-8311. ISSN 0957-4522

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Abstract

Copper metal embedded fullerene C-60 thin films are deposited on various substrates via resistive heating co evaporation technique. Rutherford back scattering simulated spectrum confirms the thickness and composition of thin film to be 32nm and 18at%, respectively. The deposited thin films are irradiated by 120MeV Ag ion beam for different fluences within the range, from 1x10(12) to 3x10(13) ions/cm(2). UV-vis absorption spectroscopy study reveals the appearance of surface plasmon resonance (SPR) band in pristine thin film at 622nm; this phenomenon is ascribed to the presence of copper nanoparticles in C-60 matrix. The SPR band intensity increases with rising fluences, which is suggestive of the growth of Cu nanoparticles. Growth of Cu nanoparticles is further confirmed by transmission electron microscopic (TEM) and X-ray diffraction (XRD) study. Whereas the conversion of C-60 into amorphous carbon (a-C) is confirmed by Raman spectroscopy, XRD results of pristine Cu-C-60 thin film record the presence of Cu2O within the nanocomposite thin film. However, both X-ray photoelectron spectroscopy (XPS) and XRD studies on irradiated thin film samples authenticate the growth of Cu metal nanoparticles with concurrent removal of oxygen.

Item Type:	Article
Additional Information:	Copyright for this article belongs to M/s Springer Verlag.
Subjects:	Engineering > Electronics and Electrical Engineering Materials Science Applied Physics/Condensed Matter
Divisions:	UNSPECIFIED
Depositing User:	Mr. Yogesh Joshi
Date Deposited:	12 Mar 2020 07:25
Last Modified:	12 Mar 2020 07:25
URI:	http://npl.csircentral.net/id/eprint/4194

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