Pasha, Sk. Khadeer and Chidambaram, K. and Vijayan, N. and W., Madhuri (2012) Structural and electrical properties of nano structure lead oxide. Optoelectronics and Advanced Materials , 6 (1-2). pp. 110-116. ISSN 1842-6573

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Lead oxide sample was prepared at low temperature by the solvo-thermal method. The lead oxide samples were characterized by X-ray diffraction (XRD), FT-IR and transmission electron spectroscopy (TEM) were employed to identify the structural phases, vibrational stretching frequencies and particle nature. X-ray diffraction studies indicate the formation of stable crystalline phase at 75 degrees C. Transmission electron microscopy and selected area electron diffraction analysis confirms the crystalline nanorods of lead oxide of size 15 - 30 nm. The results of dielectric measurements as a function of frequency, temperature and Cole - Cole plots are reported.

Item Type: Article
Additional Information: Copyright for this article belongs to M/s NATL INST OPTOELECTRONICS.
Subjects: Materials Science
Depositing User: Mr. Yogesh Joshi
Date Deposited: 22 Aug 2019 08:34
Last Modified: 22 Aug 2019 08:34

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