Silva, H. and Monasterios, G and Padilla, S. and Ginley, R. and Michaud, A. and Negi, P. S. (2018) SIM Key Comparison of S-parameters SIM.EM.RF-K5b.CL. In: 2018 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS, JUL 08-13, 2018, Paris, FRANCE.

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The first RF key comparison within the Inter-American Metrology System (SIM) Regional Metrology Organization has been carried out. The purpose of it was to establish the degree of equivalence of scattering parameters measurements of both 1-port and 2-port coaxial devices among national metrology institutes (NMIs) that belong to SIM region and in support of CIPM Mutual Recognition Agreement (MRA). The travelling standards were four devices with Type-N coaxial connectors and 50 Omega of characteristic impedance: a matched load, a mismatched load and two attenuators of 3 dB and 20 dB. Four SIM institutes participated in the comparison as well as NPLI.

Item Type: Conference or Workshop Item (Paper)
Additional Information: Copyright for this article belongs to M/s IEEE.
Subjects: Engineering > Electronics and Electrical Engineering
Instruments/ Instrumentation
Depositing User: Mr. Yogesh Joshi
Date Deposited: 18 Apr 2019 11:19
Last Modified: 18 Apr 2019 11:19

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