Tang, Y. and Ojha, V. N. and Schlamminger, S. and Ruefenacht, A. and Burroughs, C. J. and Dresselhaus, P. D. and Benz, S. P. (2012) A 10 V programmable Josephson voltage standard and its applications for voltage metrology. Metrologia, 49 (6). pp. 635-643. ISSN 0026-1394

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The concept of a programmable Josephson voltage standard (PJVS) was first proposed in 1997. Since then a significant amount of research and development work has been devoted to the fabrication of the programmable Josephson junction array and its deployment in a voltage standard system. This paper reports the recent development of a 10 V PJVS system at the National Institute of Standards and Technology (NIST) and its voltage metrology applications. The superior stability of the voltage step of the new 10 V PJVS enables it to perform the same tasks as the conventional Josephson voltage standard (JVS) that uses hysteretic voltage steps and to improve the efficiency and effectiveness of a JVS direct comparison. For the first time, a comparison between a conventional JVS and the NIST 10 V PJVS was performed in order to verify the performance of the NIST 10 V PJVS. The mean difference between the two systems at 10 V was found to be -0.49 nV with a combined standard uncertainty of 1.32 nV (k = 1) or a relative combined standard uncertainty of 1.32 parts in 10(10). Automatic comparisons between the 10 V PJVS and a 2.5 V PJVS at 1.018 V were performed to monitor the long term accuracy and stability of the 2.5 V PJVS and to support the NIST electronic kilogram experiment. By matching the voltages of the two PJVS systems during a comparison, the type B uncertainty can be minimized to a negligible level. The difference between the two PJVS at 1.018 V was found to be -0.38 nV with a combined standard uncertainty of 0.68 nV (k = 1) or a relative combined standard uncertainty of 6.7 parts in 10(10). Issues encountered during the PJVS comparison and potential challenges for 10 V applications are also discussed.

Item Type: Article
Additional Information: Copyright for this article belongs to M/s IOP Publishing.
Subjects: Instruments/ Instrumentation
Applied Physics/Condensed Matter
Depositing User: Users 27 not found.
Date Deposited: 04 Feb 2020 11:39
Last Modified: 04 Feb 2020 11:39
URI: http://npl.csircentral.net/id/eprint/3704

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