A. Bensouici, Bensouici and V. , Carcelen and Plaza, J. L. and Dios, S. De and N. , Vijayan and J., Crocco and H., Bensalah and E. , Dieguez and M. , Elaatmani (2010) Study of effects of polishing and etching processes on Cd1−xZnxTe surface quality. Journal of Crystal Growth, 312 (14). pp. 2098-2102. ISSN 0022-0248

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Abstract

The effect of surface preparation on CdZnTe properties was investigated. Surface etching using bromine solutions enhances Te elemental composition, resulting in a Te rich surface layer that is prone to oxidize. This oxidation degrades the performance of the fabricated CZT gamma detector. Roughness results were identical for samples polished with 1 and 3 μm and subsequently etched in 2% Br-MeOH. The optimal concentration of etching was 2% Br-MeOH.

Item Type:	Article
Additional Information:	Copyright for this article belongs to M/s Elsevier B.V.
Subjects:	Crystallography Materials Science Physics
Divisions:	UNSPECIFIED
Depositing User:	Ms Neetu Chandra
Date Deposited:	13 Jul 2012 08:37
Last Modified:	13 Jul 2012 08:37
URI:	http://npl.csircentral.net/id/eprint/335

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