Jha, Rajveer and Jyoti, Jeevan and Awana, V. P. S. (2013) Impact of Gd Doping on Morphology and Superconductivity of NbN Sputtered Thin Films. Journal of Superconductivity and Novel Magnetism, 26 (10). pp. 3069-3074. ISSN 1557-1939

[img] PDF - Published Version
Restricted to Registered users only

Download (648Kb) | Request a copy


We report the effect of Gd inclusion in the NbN superconductor thin films. The films are deposited on single crystalline Silicon (100) by DC reactive sputtering technique, i.e., deposition of Nb and Gd in presence of reactive N-2 gas. The fabricated relatively thick films (400 nm) are crystallized in cubic structure. These films are characterized for their morphology, elemental analysis, and roughness by Scanning Electron Microscopy (SEM), Energy Dispersive X-ray spectroscopy (EDAX), and Atomic Force Microscopy (AFM) respectively. The optimized film (maximum T (c) ) is achieved with gas ratio of Ar:N-2 (80:20) for both pristine and Gd-doped films. The optimized NbN film possesses T (c) (R=0) in zero and 140 kOe fields are at 14.8 K and 8.8 K, respectively. The Gd-doped NbN film showed T (c) (R=0) in zero and 130 kOe fields at 11.2 K and 6.8 K, respectively. The upper critical field H (c2)(0) of the studied superconducting films is calculated from the magneto-transport [R(T)H] measurements using GL equations. It is found that Gd doping deteriorated the superconducting performance of NbN.

Item Type: Article
Additional Information: Copyright for this article belongs to M/s Springer Verlag.
Subjects: Applied Physics/Condensed Matter
Depositing User: Users 27 not found.
Date Deposited: 09 Nov 2021 09:45
Last Modified: 09 Nov 2021 09:45
URI: http://npl.csircentral.net/id/eprint/3183

Actions (login required)

View Item View Item