Tsai, C. J. and Aggarwal, S. G. (2013) Overview of the Gas and Aerosol Metrology. Mapan, 28 (3). pp. 141-143. ISSN 0970-3950

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There are several exciting developments noted in gas and aerosol measurements in recent years. On the other hand not much work has been done on the calibration facility, traceable standards, and certified reference materials for this field of science. More attention and concerns are needed for the comparable and SI traceable data quality in gas and aerosol measurements. The aim of this special issue of MAPAN-Journal of Metrology Society of India is to highlight such issues.

Item Type: Article
Additional Information: Copyright for this article belongs to M/s Springer Verlag.
Subjects: Instruments/ Instrumentation
Applied Physics/Condensed Matter
Depositing User: Users 27 not found.
Date Deposited: 03 Jul 2020 11:18
Last Modified: 03 Jul 2020 11:18
URI: http://npl.csircentral.net/id/eprint/3101

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