Saini, Pooja and Jain, Harsh and Tandon, Ram P. and Singh, Surinder P. and Mahapatro, Ajit K. (2017) Temperature dependent electronic conduction through graphene oxide thin film based two terminal devices. Integrated Ferroelectrics, 184. pp. 210-216. ISSN 1058-4587

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The temperature dependent electronic conduction through GO thin films sandwitched between indium tin oxide (ITO) substrates and top thermally deposited Al electrode (Al/GO/ITO) is explained. The curent-voltage (I-V) characteristic are measured at various temperatures range of 10-100 degrees C. The temperature dependent I-V through Al/GO/ITO structures in both the forward (ITO as anode) and reverse (ITO as cathode) directions, demonstrate Ohmic behavior with an estimated value of temperature coefficient of resistance 4.2 x 10(-3) identical to the value for Al. The electrical current decreases with increasing temperature at an applied voltage, suggesting the metallic behaviour arising from the formation of Al filament through the GO films.

Item Type: Article
Additional Information: Copyright for this article belongs to M/S Taylor & Francis.
Subjects: Engineering
Applied Physics/Condensed Matter
Depositing User: Users 27 not found.
Date Deposited: 09 May 2019 08:16
Last Modified: 09 May 2019 08:16

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