Perumal, R. and Kumar, K. Senthil and Babu, S. Moorthy and Bhagavannarayana, G. (2009) Optical characterization of ferroelectric glycinium phosphite single crystals. Journal of Alloys and Compounds, 490 (1-2). pp. 342-349. ISSN 0925-8388

PDF - Published Version Restricted to Registered users only Download (1137Kb) | Request a copy

Abstract

Single crystals of glycinium phosphite (GPI) were grown by isothermal evaporation and conventional temperature-lowering techniques. Single crystal and powder X-ray diffraction analysis confirm the monoclinic structure of the as grown crystals. The structural perfection of the as grown crystal was determined through HRXRD analysis. FTIR and Raman analysis revealed the functional groups present in the grown crystals. The optical absorption of the grown crystal was analyzed and the refractive index values for different wavelengths were measured by prism coupling technique. Thermal stability, melting temperature and phase transition temperature of the as grown crystals were identified from TGA/DSC analysis. The dielectric impedance analysis indicates the continuous phase transition nature of the grown crystals. The mechanical strength and hardening co-efficient were determined from Vicker's microhardness measurements for different loads with constant dwell time. The growth mechanism and the defects were analyzed through chemical etching analysis from various crystallographic planes and etching periods.

Item Type:	Article
Additional Information:	Copyright for this article belongs to M/s Elsevier B.V.
Uncontrolled Keywords:	Growth from solution; Solubility; X-ray diffraction; Thermal characterization; Mechanical properties
Subjects:	Chemistry Materials Science Metallurgy & Metallurgical Engineering
Divisions:	UNSPECIFIED
Depositing User:	Ms Neetu Chandra
Date Deposited:	18 Jun 2012 08:51
Last Modified:	18 Jun 2012 08:51
URI:	http://npl.csircentral.net/id/eprint/270

Actions (login required)

View Item