Sharma, Rahul and Chadha, Neakanshika and Saini, Parveen (2017) Determination of defect density, crystallite size and number of graphene layers in graphene analogues using X-ray diffraction and Raman spectroscopy. Indian Journal of Pure and Applied Physics, 55 (9). 625-629. ISSN 0019-5596

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Abstract

In this study, X-ray diffraction and Raman spectroscopic techniques have been wielded for determination of number of graphene layers per domain, crystallite size, interlayer spacing and defect density in bulk samples of chemically synthesized graphitic oxide (GrO) and reduced GrO (RGrO). Particularly, the ready to use and general mathematical equations have been presented for obtaining above mentioned parameters directly using the full width half maxima (FWHM) of XRD peaks and intensity ratios of Raman D- and G-bands. The results reflect that upon reduction, crystallites shrink in dimensions ultimately leads to decrease in number of graphene layers per domain and apparent increase in defect density.

Item Type:	Article
Additional Information:	Copyright for this article belongs to M/s NISCAIR.
Subjects:	Physics
Divisions:	UNSPECIFIED
Depositing User:	Users 27 not found.
Date Deposited:	31 Aug 2018 06:14
Last Modified:	31 Aug 2018 06:14
URI:	http://npl.csircentral.net/id/eprint/2654

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