Singh, Sukhvir and Srivastava, A. K. and Lal, K. and Tomokiyo, Y. and Sharma, S. K. and Kishore, R. (2006) Microstructural features, electrical and optical properties of nanostructured InSb thin films deposited at 373 K. Indian Journal of Engineering & Materials Sciences, 13 (4). pp. 339-346. ISSN 0971-4588
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Abstract
Thin films of InSb nanocrystals have been deposited onto KCl substrate Using a thermal evaporation technique Under high vacuum conditions (similar to 10(-6) torr). Ail intriguing microstructure consisted of moire fringes with variable spacings and a corresponding variety of electron diffraction patterns in reciprocal space are reported at the deposition temperature of 373 K. The nano-rains of InSb with preferred orientation and faceted morphology are delineated. A possible mechanism has been postulated to explain the evolution of such microstructures. It has been noticed that there is a peculiarity in the resistivity characteristics and infrared transmittance measurements obtained oil these films. A set of electron micrographs, diffraction patterns and properties have been evaluated and discussed to understand the role of nanocrystals constituting the thin film, and certain types of defects introduced in the microstructure while deposition, oil these properties.
| Item Type: | Article |
|---|---|
| Subjects: | Engineering Materials Science |
| Divisions: | UNSPECIFIED |
| Depositing User: | Users 27 not found. |
| Date Deposited: | 11 May 2018 07:56 |
| Last Modified: | 11 May 2018 07:56 |
| URI: | http://npl.csircentral.net/id/eprint/2513 |
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