Singh, Preetam and Srivatsa, K. M. K. and Jewariya, Mukesh (2016) Ultrafast pump-probe spectroscopy studies of CeO2 thin film deposited on Ni-W substrate by RF magnetron sputtering. Optical Materials, 58. pp. 1-4. ISSN 0925-3467

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This study presents the first investigation of rapid dynamical processes that occur in pure CeO2 thin film, using ultra fast pump-probe spectroscopy at room temperature. For this purpose we have used a single (200) oriented CeO2 film deposited on biaxially textured Ni-W substrate by RF magnetron sputtering technique. The ultrafast transient spectra show initial sharp rise transition followed by an exponential photon decay. This rise time is about 10 ps irrespective of the probe wavelengths range 500-800 nm. The initial decay constant (tau) at 500 nm probe wavelength is found to be 171 ps, while at 800 nm probe wavelength it is 107.5 ps. The ultrafast absorption spectra show two absorption peaks at 745 and 800 nm, and are attributed to the electronic transitions from F-2(7/2)-F-2(5/2) and S-1(0)-F-1(3) respectively. The relatively high intensity absorption peak at 745 nm indicates dominant f-f electronic transition. Further, the absorption peak at 745 nm splits into two distinct peaks with respect to delay time, and is attributed to the charge transfer in between Ce4+ and Ce3+ ions. These results indicate that CeO2 itself is a potential candidate and can be used for optical applications.

Item Type: Article
Additional Information: Copyright for this article belongs to M/s Elsevier.
Uncontrolled Keywords: CeO2 thin film Magnetron sputtering Ultrafast pump-probe spectroscopy
Subjects: Materials Science
Depositing User: Dr. Rajpal Walke
Date Deposited: 23 Apr 2018 12:09
Last Modified: 23 Apr 2018 12:09

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