Malmivirta, M. and Palonen, H. and Inkinen, S. and Yao, L. D. and Tikkanen, J. and Huhtinen, H. and Jha, R. and Awana, V. P. S. and Dijken, S. van. and Paturi, P. (2016) Dirty limit scattering behind the decreased anisotropy of doped YBa2Cu3O7-delta thin films. Journal of Physics: Condensed Matter, 28 (17). pp. 175702-1. ISSN 0953-8984

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Abstract

We measured the resistivity of pulsed-laser-deposited BaCeO3 (BCO)-doped YBCO thin films containing spherical BCO particles in fields up to 30 T. The average diameter of the particles depends on the dopant concentration being below 4 nm in all the samples. Raised values of the upper critical field, B-c2, were observed in all the samples. Additionally, the parameter gamma, describing the electron mass anisotropy, decreased from 6.2 in the undoped sample to 3.1 in the 8 wt.% BCO-doped sample. These results can be explained by the increased number of defects decreasing the mean free path of electrons and thus lowering the coherence length, which in turn increases B-c2.

Item Type:	Article
Uncontrolled Keywords:	anisotropy, artificial pinning centers, critical fields, pulsed-laser deposition, YBCO
Subjects:	Applied Physics/Condensed Matter
Divisions:	UNSPECIFIED
Depositing User:	Dr. Rajpal Walke
Date Deposited:	17 Nov 2017 08:24
Last Modified:	17 Nov 2017 08:24
URI:	http://npl.csircentral.net/id/eprint/2186

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