Jain, Anubha and Kumar, Pankaj and Jain, S. C. and Muralidharan, R. and Chand, Suresh and Kumar, Vikram (2009) J–V characteristics of GaN containing traps at several discrete energy levels. Solid-State Electronics, 54 (3). pp. 288-293. ISSN 0038-1101

[img] PDF - Published Version
Restricted to Registered users only

Download (501Kb) | Request a copy


Mathematical modeling is presented to calculate the space charge limited current (SCLC) in a semiconductor containing traps at several discrete single energy levels. The effect of trap depths and trap densities is investigated in detail. If the difference in the trap energies is large, the J–V curves show humps as many as the number of trap levels. Each hump can be used to calculate a value of trap concentration. This trap concentration is the sum of all the traps at this and deeper energy levels. Accurate trap densities can only be obtained by fitting theoretical curve to the experimental J–V characteristics. The theory is compared with the experimental data taken from the literature. A very good agreement between theory and experiment is found.

Item Type: Article
Additional Information: Copyright for this article belongs to M/s Elsevier B.V.
Uncontrolled Keywords: GaN; SCLC; Trap filled limit; Discrete single level traps
Subjects: Engineering
Depositing User: Ms Neetu Chandra
Date Deposited: 15 May 2012 08:22
Last Modified: 15 May 2012 08:22
URI: http://npl.csircentral.net/id/eprint/216

Actions (login required)

View Item View Item