Karar, N. and Gupta, T. K. (2015) Study of polymers and their blends using TOF-SIMS ion imaging. Vacuum, 111. 119 -123. ISSN 0042-207X

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Abstract

Time of flight mass spectrometry (TOF-SIMS) was used to see the feasibility of viewing polymer directionality initially of simple polymers like polyethylene (PE) and then graduating to relatively more complex polymer composites involving poly-urethene (PU) and Carbon Nano Tube (CNT) admixture with different mixture concentrations using the Bi ion source. Based on the ion images obtained, it is suggested that directional characteristics of polyethylene, or polyurethane were not visible. However, CNT clusters were identifiable in the pure form of the material and so was CNT inside the admixture. Change in cluster shape inside the admixture at different concentrations indicated the extent of change in strength in the polymer mixture to expect. It was possible to correlate such information with the polymer tensile strength and hardness data measured separately by traditional methods. Similar analysis of high resolution TOF-SIMS ion imaging of other polymer blends are likely to fetch important information on why certain compositions are stronger or why certain compositions do not have the desired or expected properties.

Item Type:	Article
Uncontrolled Keywords:	Polymers TOF-SIMS Ion imaging
Subjects:	Materials Science Applied Physics/Condensed Matter
Divisions:	UNSPECIFIED
Depositing User:	Dr. Rajpal Walke
Date Deposited:	21 Oct 2016 05:21
Last Modified:	21 Oct 2016 05:21
URI:	http://npl.csircentral.net/id/eprint/2014

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