R. , Ramesh Babu and R. , Ramesh and R. , Gopalakrishnan and K. , Ramamurthi and G. , Bhagavannarayana (2010) Growth, structural, spectral, mechanical and optical properties of pure and metal ions doped sulphamic acid single crystals. Spectrochimica Acta Part A: Molecular and Biomolecular Spectroscopy, 76 (5). pp. 470-475. ISSN 1386-1425

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Bulk single crystals of pure and metal ions (Mn2+, Cu2+ and Ni2+) doped sulphamic acid (SA) have been grown by conventional and unidirectional solution growth methods. Intensities of powder X-ray diffraction peaks of metal ions doped SA reveal that these dopants enhanced the crystallanity. The peak broadening and intensity variation in some frequency regions in FT-IR spectra show the incorporation of dopants in the SA lattice. Mn2+ and Cu2+ doped SA single crystals show high crystalline perfection (FWHM 5.5 arc s) compared to pure and Ni2+ metal ions doped SA crystals. The grown pure and Mn2+, Cu2+ and Ni2+ ions doped SA crystals have transparency in the order SA > Mn:SA > Cu:SA > Ni:SA. The hardness value of Ni2+ doped crystal is relatively less than that of the pure and other metal ions doped SA crystals. Pure and Ni2+ ions doped SA crystals possess high dielectric constants than that of Cu2+ and Mn2+ ions doped crystals. From the SEM micrograph analyses, it is observed that the doping of these metal ions modify the surface morphology of the grown crystals.

Item Type: Article
Additional Information: Copyright for this article belongs to M/s Elsevier B.V.
Uncontrolled Keywords: Metal ion dopants; Single crystal; Unidirectional solution growth; Sulphamic acid; High-resolution X-ray diffraction; Dielectric studies
Subjects: Spectroscopy
Depositing User: Ms Neetu Chandra
Date Deposited: 03 May 2012 06:51
Last Modified: 03 May 2012 06:51
URI: http://npl.csircentral.net/id/eprint/185

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