Peramaiyan, G. and MohanKumar, R. and Bhagavannarayana, G. (2014) Crystal growth, structural, optical and dielectric studies of ammonium p-toluenesulfonate. Journal of Crystal Growth , 408. pp. 14-18. ISSN 0022-0248

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Abstract

Ammonium p-toluenesullonate single crystals (AMPTS) were grown by a slow cooling solution growth technique. The unit cell parameters and morphology of AMPTS crystal were found out by single crystal X-ray diffraction study. High-resolution X-ray diffraction study revealed the crystalline perfection and the absence of structural grain boundaries. UV-vis-NlR transmission studies revealed that the AMPTS crystal is transparent in the entire visible region with a lower optical cut-off wavelength of 278 nm. From the thermogravimetric and differential thermal analyses, the melting point of AMPTS crystal was found to be 145 degrees C. The single and multiple shots laser damage thresholds of AMPTS crystal were found to be 4.08 and 3.18 GW/cm(2) respectively, for 1064 nm wavelength of Nd:YAG laser radiation. The relative second harmonic generation efficiency of AMPTS was found to be 0.7 times that of KDP. The three independent dielectric tensor components epsilon(11)=86.56-44.32, epsilon(22)-83.80-4144 and epsilon(33)=82.03-42.67 were calculated from the dielectric measurement studies.

Item Type:	Article
Additional Information:	Copyright for this article belongs to M/S Elsevier.
Uncontrolled Keywords:	HighresolutionX-raydiffraction Growthfromsolutions Organiccompounds Nonlinearopticalmaterials Nonlinearoptical
Subjects:	Crystallography Materials Science
Divisions:	UNSPECIFIED
Depositing User:	Dr. Rajpal Walke
Date Deposited:	17 Sep 2015 11:21
Last Modified:	17 Sep 2015 11:21
URI:	http://npl.csircentral.net/id/eprint/1217

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