Chawla, Parul and Singh, Son and Vashishtha, Parth and Chand, Suresh and Sharma, Shailesh N. (2014) Comparison of Incorporation of Na via In-situ and Ex-situ modes for the Realization of Device Quality CIGSe Thin Films. PHYSICS OF SEMICONDUCTOR DEVICES Book Series: Environmental Science and Engineering: Environmental Engineering . pp. 351-354. ISSN 1863-5520

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Abstract

Essentiality of Na incorporation into the CIGSe films is required in order to have highly crystalline films along with grain boundaries' passivation. Our work focuses on comparison of two different methods to ensure the optimized sodium incorporation into the film to obtain device-quality material and thus high conversion efficiencies

Item Type:	Article
Additional Information:	Copyright for this article belongs to M/S Springer International Publishing.
Subjects:	Engineering Materials Science Physics
Divisions:	UNSPECIFIED
Depositing User:	Dr. Rajpal Walke
Date Deposited:	17 Sep 2015 11:06
Last Modified:	17 Sep 2015 11:06
URI:	http://npl.csircentral.net/id/eprint/1208

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