Rajeev Gandhi , Jayavelu and Rathnakumari, Muthian and Muralimanohar, Pandarinathan and Sureshkumara, Palanivel and Bhagavannarayana, Godavarthi (2014) Analysis of crystalline perfection of pure and Modoped KTP crystals on different growth planes by high-resolution X-ray diffraction. Journal of Applied Crystallography, 47. pp. 931-935. ISSN 0021-8898
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Abstract
Single crystals of pure and molybdenum (Mo)-doped potassium titanyl phosphate (KTP) crystals were grown by the high-temperature solution growth technique. The presence of dopant ions in the grown crystal was confirmed by energy-dispersive X-ray analysis. Grown crystals, cut along various growth planes such as (100), (011) or (201), were analysed for crystalline perfection using high-resolution X-ray diffraction (HRXRD). Although the HRXRD study showed that the crystalline perfection of most of the crystals was quite good without any structural defects, structural grain boundaries were observed in some of the crystals chosen for study. The observed structural defects are probably due to mechanical or thermal fluctuations occurring during the growth process.
| Item Type: | Article |
|---|---|
| Subjects: | Crystallography Crystallography > X-Ray Crystallography |
| Divisions: | UNSPECIFIED |
| Depositing User: | Dr. Rajpal Walke |
| Date Deposited: | 09 Sep 2015 06:18 |
| Last Modified: | 09 Sep 2015 06:18 |
| URI: | http://npl.csircentral.net/id/eprint/1163 |
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