-, Babita and Sharma, Divya K. and -, Satish and Ansari, M. A. and Saxena, A. K.
(2014)
A versatile automation program using LabVIEW for low de current measurement.
Journal of Scientific and Industrial Research, 73 (2).
pp. 91-94.
ISSN 0022-4456
Abstract
The need for precision measurement of de current in the nanoampere and picoampere ranges is continuously increasing. The present paper discusses in detail the establishment of measurement facility for the first time at NPLI for these low level DC current ranges by using primary measurement standards of DC voltage and DC resistance. The same has been implemented by developing the fully automated system. The automation provides an efficient way for the low level current measurement as measuring sub nanoampere current manually is subjected to various sources of errors
| Item Type: |
Article
|
| Uncontrolled Keywords: |
precision, current measurement, electrometer, automation |
| Subjects: |
Engineering |
| Divisions: |
UNSPECIFIED |
| Depositing User: |
Dr. Rajpal Walke
|
| Date Deposited: |
08 Sep 2015 10:24 |
| Last Modified: |
08 Sep 2015 10:24 |
| URI: |
http://npl.csircentral.net/id/eprint/1156 |
Actions (login required)
 |
View Item |
